Facilities

Tecnai F30
Sample Preparation Instruments
Software

Tecnai F30

The FEI Tecnai F30 is a scanning transmission electron microscope (STEM) that forms the centerpiece of the Electron Microscopy Core Facility. The microscope can be operated at the maximum accelerating voltage of 300 kV and is capable of atomic resolution imaging in both TEM and STEM modes. The microscope uses a Schottky field emission gun as its electron source, providing the highest current density and the smallest electron probe-size, which are critical for high spatial-resolution analysis using the scanning mode.The microscope is currently equipped with a high performance CCD camera with 4k x 4k resolution for image recording, an X-ray energy dispersive spectrometer (EDX) for compositional analysis, and STEM detectors for bright-field, annular dark-field, and high-angle annual dark-field (Z-contrast) imaging.

High brightness Schottky emitter operated at 300 kV
digital CCD camera with 4k x 4k image resolution
high-resolution TEM imaging with the point-to-point resolution of 0.2 nm
STEM imaging at the spatial resolution of 0.2 nm
EDX for elemental analysis
Standard single-tilt and low-background (Be) double-tilt holders
low dose capability
tomography capability

Sample Preparation Instruments

Ultracut E Microtome for sectioning
Edwards Auto 306 Evaporator for carbon coating and glowdischarge

Software

Gatan DigitalMicrograph
Focal-Series High-Resolution Reconstruction Package
Tomography Acquisition and Reconstruction Package


electron microscopy

electron microscopy HOME: Facilities
Facilities Tecnai F30 Sample Preparation Instruments Software Tecnai F30 The FEI Tecnai F30 is a scanning transmission electron microscope (STEM) that forms the centerpiece of the Electron Microscopy Core Facility. The microscope can be operated at the maximum accelerating voltage of 300 kV and is capable of atomic resolution imaging in both TEM and STEM modes. The microscope uses a Schottky field emission gun as its electron source, providing the highest current density and the smallest electron probe-size, which are critical for high spatial-resolution analysis using the scanning mode.The microscope is currently equipped with a high performance CCD camera with 4k x 4k resolution for image recording, an X-ray energy dispersive spectrometer (EDX) for compositional analysis, and STEM detectors for bright-field, annular dark-field, and high-angle annual dark-field (Z-contrast) imaging. High brightness Schottky emitter operated at 300 kV digital CCD camera with 4k x 4k image resolution high-resolution TEM imaging with the point-to-point resolution of 0.2 nm STEM imaging at the spatial resolution of 0.2 nm EDX for elemental analysis Standard single-tilt and low-background (Be) double-tilt holders low dose capability tomography capability Sample Preparation Instruments Ultracut E Microtome for sectioning Edwards Auto 306 Evaporator for carbon coating and glowdischarge Software Gatan DigitalMicrograph Focal-Series High-Resolution Reconstruction Package Tomography Acquisition and Reconstruction Package

electron microscopy

electron microscopy
electron microscopy
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